STM32F205RFT6 datasheet(131/184 Pages) STMICROELECTRONICS

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STM32F20xxx

Electrical characteristics

183

Figure 56. 12-bit buffered/non-buffered DAC

1. The DAC integrates an output buffer that can be used to reduce the output impedance and to drive external

loads directly, without the use of an external operational amplifier. The buffer can be bypassed by

configuring the BOFFx bit in the DAC_CR register.

6.3.22

Temperature sensor characteristics

Update

rate(2)

Max frequency for a

correct DAC_OUT change

when small variation in the

input code (from code i to

i+1LSB)

MS/s

CLOAD ≤ 50 pF,

RLOAD ≥ 5 kΩ

tWAKEUP(4)

Wakeup time from off state

(Setting the ENx bit in the

DAC Control register)

6.5

µs

CLOAD ≤ 50 pF, RLOAD ≥ 5 kΩ

input code between lowest and highest

possible ones.

PSRR+ (2)

Power supply rejection

ratio (to VDDA) (static DC

measurement)

–67

–40

dB No RLOAD, CLOAD = 50 pF

1. On devices in WLCSP64+2 package, if IRROFF is set to VDD, the supply voltage can drop to 1.7 V when the device

operates in the 0 to 70 °C temperature range using an external power supply supervisor (see Section 3.16).

2. Guaranteed by design, not tested in production.

3. The quiescent mode corresponds to a state where the DAC maintains a stable output level to ensure that no dynamic

consumption occurs.

4. Guaranteed by characterization results, not tested in production.

Table 68. DAC characteristics (continued)

Symbol

Parameter

Min

Typ

Max

Unit

Comments

R L

C L

Buffered/Non-buffered DAC

DAC_OUTx

Buffer(1)

12-bit

digital to

analog

converter

ai17157V2

Table 69. Temperature sensor characteristics

Symbol

Parameter

Min

Typ

Max

Unit

TL(1)

1. Guaranteed by characterization results, not tested in production.

VSENSE linearity with temperature

±1

±2°C

Avg_Slope(1) Average slope

2.5

mV/°C

V25(1)

Voltage at 25 °C

0.76

tSTART(2)

2. Guaranteed by design, not tested in production.

Startup time

µs

TS_temp(2)

ADC sampling time when reading the

temperature (1 °C accuracy)

µs

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