ISO1430DWR datasheet(32/49 Pages) TI2

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Figure 10-5. Eye Diagram at 50 Mbps Clock, VCC2 = 5 V, 25°C

10.2.3.1 Insulation Lifetime

Insulation lifetime projection data is collected by using industry-standard Time Dependent Dielectric Breakdown

(TDDB) test method. In this test, all pins on each side of the barrier are tied together creating a two-terminal

device and high voltage applied between the two sides; See Figure 10-6 for TDDB test setup. The insulation

breakdown data is collected at various high voltages switching at 60 Hz over temperature. For reinforced

insulation, VDE standard requires the use of TDDB projection line with failure rate of less than 1 part per million

(ppm). Even though the expected minimum insulation lifetime is 20 years at the specified working isolation

voltage, VDE reinforced certification requires additional safety margin of 20% for working voltage and 87.5% for

lifetime which translates into minimum required insulation lifetime of 37.5 years at a working voltage that's 20%

higher than the specified value.

Figure 10-7 shows the intrinsic capability of the isolation barrier to withstand high voltage stress over its lifetime.

Based on the TDDB data, the intrinsic capability of the insulation is 1060 VRMS with a lifetime of 220 years. Other

factors, such as package size, pollution degree, material group, etc. can further limit the working voltage of the

component. The working voltage of DW-16 is specified up to 1060 VRMS . At the lower working voltages, the

corresponding insulation lifetime is much longer than 220 years.

DUT

Vcc 2

Vcc 1

GND 1

GND 2

Ovenat150°C

TimeCounter

> 1 mA

Figure 10-6. Test Setup for Insulation Lifetime Measurement

ISO1450, ISO1452, ISO1410, ISO1412, ISO1430, ISO1432

SLLSF22H – APRIL 2018 – REVISED JUNE 2024

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ISO1430DWR 데이터시트(PDF) 32 Page - Texas Instruments