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FZ-SF/SFC 데이터시트(PDF) 5 Page - Omron Electronics LLC

부품명 FZ-SF/SFC
상세설명  AI-based defect detection that exceeds the ability of expert inspectors
PDF  54 Pages
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제조업체  OMRON [Omron Electronics LLC]
홈페이지  http://www.omron.com/index3.html
Logo OMRON - Omron Electronics LLC

FZ-SF/SFC 데이터시트(HTML) 5 Page - Omron Electronics LLC

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Test is automatically performed
using images prepared in Step 1.
You don’t need to adjust parameters
for differential inspections.
When a good product is judged
as defective, AI gives each image
a correlation score to visualize
the degree of overdetection. This
facilitates selecting images that need
to be learned to reduce overdetection.
5
Prepare images
1
2
3
Create model
Check results
Good
product
image
Defective
product
image
AI makes it easy to avoid overdetection
Three quick steps on the settings screen guide the user through the process of creating the good product model with
the minimum number of images.
Image A:10
Image B:150
Correlation score
AI model
AI Fine Matching identifies a future
that is not included in good products
as a defect.
AI learns images of good products
with variations, and generates an AI
model.
Every time an inspection is carried
out, AI reconstructs a model that is
presumed to be a good product.
AI extracts a difference between the
reconstructed good product image
and a captured image to identify a
defect, reducing overdetection.
Although standard AI processing
requires a huge number of
images for learning, the FH
Series requires only 100 to 200
images.
The system suggests images to
learn, helping to complete the
good product model.
*1. “Patent pending” means that we applied for a patent in Japan, and “Patented” means that we obtained a patent in Japan. (as of May 2022)
Shifted to upper right
Shifted to lower left
Reconstructs a good
product image considering
different views of holes
Captured image
AI model
Reconstructed
good product image
*1
PATENT PENDING
AI makes it easy
AI makes it easy
AI reduces overdetection
AI Fine Matching



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