74HC_HCT30

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Product data sheet

Rev. 7 — 2 December 2015

8 of 15

NXP Semiconductors

74HC30; 74HCT30

8-input NAND gate

Test data is given in Table 9.

Definitions for test circuit:

RT = termination resistance should be equal to the output impedance Zo of the pulse generator.

CL = load capacitance including jig and probe capacitance.

Fig 6.

Test circuit for measuring switching times

Table 9.

Test data

Type

Input

Load

Test

VI

tr, tf

CL

74HC30

VCC

6.0 ns

15 pF, 50 pF

tPLH, tPHL

74HCT30

3.0 V

6.0 ns

15 pF, 50 pF

tPLH, tPHL