STLC5465B datasheet(43/101 Pages) STMICROELECTRONICS

43 / 101 page

III - FUNCTIONAL DESCRIPTION (continued)

INITIALIZATION

BLOC K

HDLC (Tx a nd Rx)

INTER RUP T QUE UE

MON (Rx)

INTER RUP TQUE UE

C/I (Rx)

INTER RUP T QUE UE

IBA

IBA + 254

IBA + 256

+ HDLC

Que ue Size

IBA + 256

+ HDLC

Que ue S ize

+ MON

Que ue S ize

Figure 33 : The Three Circular Interrupt Memories

III.9 - Watchdog

This function is used to control the activity of the

application. It is composed of a counter which

counts down from an initial value loaded in the

Timer register by the microprocessor.

If the microprocessor doesn’t reset this counter

before it is totally decremented, the external Pin

WDO is activated ; this signal can be used to reset

the microprocessor and all the application.

The initial time value of the counter is programma-

ble from 0 to 15s in increments of 0.25ms.

At the reset of the component, the counter is auto-

matically initialized by the value corresponding to

512ms which are indicated in the Timer register.

The microprocessor must put WDR (IDCR Regis-

ter) to”1” to reset this counter and to confirm that

the application started correctly.

In the reverse case, the WDO signal could be used

to reset the board a second time.

The FS signal (8kHz) divided by two or the XTAL1

signal (typically 32768kHz) divided by 8192 can be

selected to increment the counter. At reset the

watchdog is incremented by the XTAL1 signal.

III.10 - Reset

There are two possibilities to reset the circuit :

- by software,

- by hardware.

Each programmable register receives its default

value. After that, the default value of each data

for Time slot Assigner memory.

III.11 - Boundary Scan

The Multi-HDLC is equipped with an IEEE Stand-

ard Test Access Port (IEEEStd1149.1).The bound-

ary scan technique involves the inclusion of a shift

that signals at component boundaries can be con-

trolled and observed using scan testing principle.

Its intention is to enable the test of on board inter-

connections and ASIC production tests.

The external interface of the Boundary Scan is

composed of the signals TDI, TDO, TCK, TMS and

TRST as defined in the IEEE Standard.

STLC5465B

43/101

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