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HD404612FS 데이터시트(PDF) 79 Page - Renesas Technology Corp |
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HD404612FS 데이터시트(HTML) 79 Page - Renesas Technology Corp |
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79 / 91 page ![]() HD404618 Series 77 Item Symbol Pin(s) Min Typ Max Unit Test Condition Notes Current dissipation in subactive mode I SUB V CC 50 100 µAV CC = 3 V LCD on 35 70 µA6 Current dissipation in watch mode (1) I WTC1 V CC 515 µAV CC = 3 V LCD off Current dissipation in watch mode (2) I WTC2 V CC 15 35 µAV CC = 3 V LCD on Comparator input reference voltage scope VC ref VC ref 0— V CC – 1.2 V Notes: 1. Output buffer current is excluded. 2. I CC is the source current when no I/O current is flowing while the MCU is in reset state. Test conditions: MCU: Reset Pins: RESET, TEST at V CC 3. I SBY is the source current when no I/O current is flowing while the MCU timer is in operation. Test conditions: D 12, D13 in digital input mode DTMF in operation (excludes current flowing from VT ref to GND) 4. Pins D 12 and D 13 are in analog input mode and I/O current is not flowing. Test conditions: VC ref/D11, COMP0/D12, COMP1/D13 at GND DTMF stopped 5. Timer is in operation and I/O current is not flowing. Test conditions: MCU: I/O in reset state Serial interface stopped D 12, D13 in digital input mode DTMF stopped Stanby mode Pins : RESET at GND TEST at V CC 6. Applies only to HD404612, HD404614, HD404616, and HD404618. 7. RAM data retention. |
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