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STM32F103C4T7XXX 데이터시트(PDF) 64 Page - STMicroelectronics

부품명 STM32F103C4T7XXX
상세설명  Low-density performance line, ARM-based 32-bit MCU with 16 or 32 KB Flash, USB, CAN, 6 timers, 2 ADCs, 6 communication interfaces
PDF  80 Pages
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제조업체  STMICROELECTRONICS [STMicroelectronics]
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STM32F103C4T7XXX 데이터시트(HTML) 64 Page - STMicroelectronics

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Electrical characteristics
STM32F103x4, STM32F103x6
64/80
Doc ID 15060 Rev 3
Equation 1: RAIN max formula:
The formula above (Equation 1) is used to determine the maximum external impedance allowed for an
error below 1/4 of LSB. Here N = 12 (from 12-bit resolution).
Table 46.
RAIN max for fADC = 14 MHz
(1)
1.
Based on characterization, not tested in production.
Ts (cycles)
tS (µs)
RAIN max (k)
1.5
0.11
0.4
7.5
0.54
5.9
13.5
0.96
11.4
28.5
2.04
25.2
41.5
2.96
37.2
55.5
3.96
50
71.5
5.11
NA
239.5
17.1
NA
Table 47.
ADC accuracy - limited test conditions(1) (2)
1.
ADC DC accuracy values are measured after internal calibration.
2.
ADC Accuracy vs. Negative Injection Current: Injecting negative current on any of the standard (non-
robust) analog input pins should be avoided as this significantly reduces the accuracy of the conversion
being performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to
standard analog pins which may potentially inject negative current.
Any positive injection current within the limits specified for IINJ(PIN) and IINJ(PIN) in Section 5.3.12 does not
affect the ADC accuracy.
Symbol
Parameter
Test conditions
Typ
Max(3)
3.
Based on characterization, not tested in production.
Unit
ET
Total unadjusted error
fPCLK2 = 56 MHz,
fADC = 14 MHz, RAIN < 10 k,
VDDA = 3 V to 3.6 V
TA = 25 °C
Measurements made after
ADC calibration
±1.3
±2
LSB
EO
Offset error
±1
±1.5
EG
Gain error
±0.5
±1.5
ED
Differential linearity error
±0.7
±1
EL
Integral linearity error
±0.8
±1.5
R
AIN
T
S
f
ADC
C
ADC
2
N2
+

ln
--------------------------------------------------------------
R
ADC
–



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