ATmega325P datasheet(229/364 Pages) ATMEL

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8023F–AVR–07/09

ATmega325P/3250P

23. IEEE 1149.1 (JTAG) Boundary-scan

23.1

Features

• JTAG (IEEE std. 1149.1 compliant) Interface

• Boundary-scan Capabilities According to the JTAG Standard

• Full Scan of all Port Functions as well as Analog Circuitry having Off-chip Connections

• Supports the Optional IDCODE Instruction

• Additional Public AVR_RESET Instruction to Reset the AVR

23.2

Overview

The Boundary-scan chain has the capability of driving and observing the logic levels on the digi-

tal I/O pins, as well as the boundary between digital and analog logic for analog circuitry having

off-chip connections. At system level, all ICs having JTAG capabilities are connected serially by

the TDI/TDO signals to form a long Shift Register. An external controller sets up the devices to

drive values at their output pins, and observe the input values received from other devices. The

controller compares the received data with the expected result. In this way, Boundary-scan pro-

vides a mechanism for testing interconnections and integrity of components on Printed Circuits

Boards by using the four TAP signals only.

The four IEEE 1149.1 defined mandatory JTAG instructions IDCODE, BYPASS, SAMPLE/PRE-

LOAD, and EXTEST, as well as the AVR specific public JTAG instruction AVR_RESET can be

used for testing the Printed Circuit Board. Initial scanning of the Data Register path will show the

ID-Code of the device, since IDCODE is the default JTAG instruction. It may be desirable to

have the AVR device in reset during test mode. If not reset, inputs to the device may be deter-

mined by the scan operations, and the internal software may be in an undetermined state when

exiting the test mode. Entering reset, the outputs of any port pin will instantly enter the high

impedance state, making the HIGHZ instruction redundant. If needed, the BYPASS instruction

can be issued to make the shortest possible scan chain through the device. The device can be

set in the reset state either by pulling the external RESET pin low, or issuing the AVR_RESET

instruction with appropriate setting of the Reset Data Register.

The EXTEST instruction is used for sampling external pins and loading output pins with data.

The data from the output latch will be driven out on the pins as soon as the EXTEST instruction

is loaded into the JTAG IR-Register. Therefore, the SAMPLE/PRELOAD should also be used for

setting initial values to the scan ring, to avoid damaging the board when issuing the EXTEST

instruction for the first time. SAMPLE/PRELOAD can also be used for taking a snapshot of the

external pins during normal operation of the part.

The JTAGEN Fuse must be programmed and the JTD bit in the I/O Register MCUCR must be

cleared to enable the JTAG Test Access Port.

When using the JTAG interface for Boundary-scan, using a JTAG TCK clock frequency higher

than the internal chip frequency is possible. The chip clock is not required to run.

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