Charging

Algorithm

SBS v1.1

Data

SHA-1

Authentication

Cell Balancing

Algorith &

Control

Overvoltage&

Undervoltage

Protection

Overcurrent

Protection

FailSafe

Protection

32kHz Clock

Generator

System

Interface

Temperature

Measurement

& Protection

bq29330

Validation &

Control

Cell & Pack

Voltage

Measurement

Impedance

Track™ Gas

Gauging

LDO/Therm

Drive

Watchdog, Reset, &

Protection Timing

Registers

System

Interface

Voltage Level

Translator

Overcurrent &

Short Circuit

Protection

N-Ch FET Drive

& Charge Pumps

Therm

I

Supply Voltage

Reset

32KHz

Alert

bq294xy

Pack +

Pack -

RSNS

5mΩ - 20m Ω typ

SMBus

Fuse

DISP

LED Display

Discharge/Charge/

Pre-Charge FETs

bq29330

bq20z60-R1

bq20z60-R1

SLUS991 – DECEMBER 2009

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

SYSTEM PARTITIONING DIAGRAM

PACKAGE THERMAL DATA

Table 2.

DERATING FACTOR

DEVICE

PACKAGE

POWER RATING

POWER RATING

POWER RATING

bq20z60-R1

TSSOP-30

63.9°C/W

1565mW

15.65mW/°C

861mW

626mW

2

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Product Folder Link(s) :bq20z60-R1