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TS2GCF133 데이터시트(PDF) 79 Page - Transcend Information. Inc.

부품명 TS2GCF133
상세설명  133X CompactFlash Card
PDF  81 Pages
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제조업체  TRANSCEND [Transcend Information. Inc.]
홈페이지  http://www.transcendusa.com
Logo TRANSCEND - Transcend Information. Inc.

TS2GCF133 데이터시트(HTML) 79 Page - Transcend Information. Inc.

Back Button TS2GCF133 Datasheet HTML 73Page - Transcend Information. Inc. TS2GCF133 Datasheet HTML 74Page - Transcend Information. Inc. TS2GCF133 Datasheet HTML 75Page - Transcend Information. Inc. TS2GCF133 Datasheet HTML 76Page - Transcend Information. Inc. TS2GCF133 Datasheet HTML 77Page - Transcend Information. Inc. TS2GCF133 Datasheet HTML 78Page - Transcend Information. Inc. TS2GCF133 Datasheet HTML 79Page - Transcend Information. Inc. TS2GCF133 Datasheet HTML 80Page - Transcend Information. Inc. TS2GCF133 Datasheet HTML 81Page - Transcend Information. Inc.  
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133X CompactFlash Card
Transcend Information Inc.
79
SMART Command Set
SMART Command Set
SMART Command Set
SMART Command Set
SMART Command Set
SMART Feature Register Values
D0h
Read Data
D4h
Execute OFF-LINE Immediate
D1h
Read Attribute Threshold
D8h
Enable SMART Operations
D2h
Enable/Disable Autosave
D9h
Disable SMART Operations
D3h
Save Attribute Values
DAh
Return Status
1.
If reserved size is below the Threshold, the status can be read from Cylinder register by Return Status command
(DAh).
SMART Data Structure
BYTE
F / V
Decription
0-1
X
Revision code
2-361
X
Vendor specific
362
V
Off line data collection status
363
X
Self-test execution status byte
364-365
V
Total time in seconds to complete off-line data collection activity
366
X
Vendor specific
367
F
Off-line data collection capability
368-369
F
SMART capability
370
F
Error logging capability
7-1 Reserved
0 1=Device error logging supported
371
X
Vendor specific
372
F
Short self-test routine recommended polling time (in minutes)
373
F
Extended self-test routine recommended polling time (in minutes)
374
F
Conveyance self-test routine recommended polling time (in minutes)
375-385
R
Reserved
386-395
F
Date Code
396
V
Number of MU in device (0~n)
397+(n*6)
V
MU number
398+(n*6)
V
MU data block
400+(n*6)
V
MU spare block
401+(n*6)
V
Init. Bad block
402+(n*6)
V
Last Defect Bad block ( Newest state)



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