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SE97BTP 데이터시트(PDF) 8 Page - NXP Semiconductors |
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SE97BTP 데이터시트(HTML) 8 Page - NXP Semiconductors |
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8 / 53 page ![]() SE97B_1 © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 01 — 27 January 2010 8 of 53 NXP Semiconductors SE97B DDR memory module temp sensor with integrated SPD [1] Between Tamb ≥ Tth(crit) and Tamb < Tth(crit) − Thys the EVENT output is in Comparator mode and bit 0 of CONFIG (EVENT output mode) is ignored. Refer to Table 4 for figure note information. Fig 4. EVENT output condition 002aae763 time temperature ( °C) critical EVENT in Interrupt mode EVENT in Comparator mode software interrupt clear Lower Boundary Alarm Upper Boundary Alarm EVENT in ‘Critical Temp only’ mode (1) (2) (1) (3) (4) (3)(5) (7) (6) (4) (2) Tamb Ttrip(l) − Thys Ttrip(u) − Thys Tth(crit) − Thys Ttrip(u) − Thys Ttrip(l) − Thys Table 4. EVENT output condition Figure note EVENT output boundary conditions EVENT output Temperature Register Status bits Comparator mode Interrupt mode Critical Temp only mode Bit 15 Above Critical Trip Bit 14 Above Alarm Window Bit 13 Below Alarm Window (1) Tamb ≥ Ttrip(l) HLH 0 0 0 (2) Tamb < Ttrip(l) − Thys LL H 0 0 1 (3) Tamb > Ttrip(u) LL H 0 1 0 (4) Tamb ≤ Ttrip(u) − Thys HLH 0 0 0 (5) Tamb ≥ Tth(crit) LL L 1 1 0 (6) Tamb < Tth(crit) − Thys LH H 0 1 0 (7) Table note [1] |
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