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SE97BTP 데이터시트(PDF) 9 Page - NXP Semiconductors |
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SE97BTP 데이터시트(HTML) 9 Page - NXP Semiconductors |
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9 / 53 page ![]() SE97B_1 © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 01 — 27 January 2010 9 of 53 NXP Semiconductors SE97B DDR memory module temp sensor with integrated SPD 7.3.2 EVENT thresholds 7.3.2.1 Alarm window The device provides a comparison window with an UPPER trip point and a LOWER trip point, programmed through the Upper Boundary Alarm Trip register (02h), and Lower Boundary Alarm Trip register (03h). The Upper Boundary Alarm Trip register holds the upper temperature trip point, while the Lower Boundary Alarm Trip register holds the lower temperature trip point as modified by hysteresis as programmed in the Configuration register. When enabled, the EVENT output triggers whenever entering or exiting (crossing above or below) the alarm window. • Advisory note: – NXP device: The EVENT output can be cleared through the clear EVENT bit or SMBus Alert Response Address (ARA). – Competitor device: The EVENT output can be cleared only through the clear EVENT bit. – Work-around: Only clear EVENT output using the EVENT bit if both NXP and competitor devices are used. The Upper Boundary Alarm Trip should always be set above the Lower Boundary Alarm Trip. The alarm window limit is immediately compared with the temperature register even if it has not been recently updated (e.g., device has been in standby) when the EVENT is turned on (CONFIG[3]). Consider waiting one conversion cycle (125 ms) after setting the alarm window limit before enabling the EVENT output/comparing the alarm window limit with the temperature register to ensure that there is correct data in the temperature register. If SMBUS[2] is set, then the alarm window limit will only be compared to the Temperature register after it has been updated when EVENT is turned on. 7.3.2.2 Critical trip The Tth(crit) temperature setting is programmed in the Critical Alarm Trip register (04h) as modified by hysteresis as programmed in the Configuration register. When the temperature reaches the critical temperature value in this register (and EVENT is enabled), the EVENT output asserts and cannot be de-asserted until the temperature drops below the critical temperature threshold. The Event cannot be cleared through the clear EVENT bit or SMBus Alert. The Critical Alarm Trip should always be set above the Upper Boundary Alarm Trip. The critical trip limit is immediately compared with the temperature register even if it has not been recently updated (e.g., device has been in standby) when the EVENT is turned on (CONFIG[3]). Consider waiting one conversion cycle (125 ms) after setting the critical trip limit before enabling the EVENT output/comparing the critical trip limit with the temperature register to ensure that there is correct data in the temperature register. If SMBUS[2] is set, then the alarm window limit will only be compared to the Temperature register after it has been updated when EVENT is turned on. |
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