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IP4365CX11/P 데이터시트(PDF) 6 Page - NXP Semiconductors |
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IP4365CX11/P 데이터시트(HTML) 6 Page - NXP Semiconductors |
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6 / 12 page ![]() IP4365CX11_1 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 01 — 26 March 2010 6 of 12 NXP Semiconductors IP4365CX11 Integrated SIM card passive filter array and USB ESD protection 7.3 Crosstalk The crosstalk measurement configuration of a typical 50 Ω NWA system for evaluation of the IP4365CX11 is shown in Figure 6. Six typical examples of crosstalk measurement results of IP4365CX11 are depicted in Figure 7. Unused channels are terminated with 50 Ω to ground. Fig 6. Crosstalk measurement configuration (1) Pin B1 to pin C3. (2) Pin B1 to pin A3. (3) Pin A1 to pin B3. Fig 7. Measured crosstalk between different channels OUT_2 001aai756 50 Ω 50 Ω Vgen DUT IN_1 OUT_1 IN_2 TEST BOARD 50 Ω 50 Ω 008aaa215 −60 −40 −80 −20 0 −100 f (MHz) 1104 103 10 102 (1) (2) (3) αct (dB) |
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