| 전자부품 데이터시트 검색엔진 |
|
MPC5643L 데이터시트(PDF) 22 Page - Freescale Semiconductor, Inc |
|
|
|||||||||||||||||||||||||||||
MPC5643L 데이터시트(HTML) 22 Page - Freescale Semiconductor, Inc |
|
22 / 136 page ![]() MPC5643L Microcontroller Data Sheet, Rev. 8.1 Introduction Freescale Semiconductor 22 • Single high supply required: nominal 3.3 V both for packaged and Known Good Die option — Packaged option requires external ballast transistor due to reduced dissipation capacity at high temperature but can use embedded transistor if power dissipation is maintained within package dissipation capacity (lower frequency of operation) — Known Good Die option uses embedded ballast transistor as dissipation capacity is increased to reduce system cost • All I/Os are at same voltage as external supply (3.3 V nominal) • Duplicated Low-Voltage Detectors (LVD) to guarantee proper operation at all stages (reset, configuration, normal operation) and, to maximize safety coverage, one LVD can be tested while the other operates (on-line self-testing feature) 1.5.41 Built-In Self-Test (BIST) capability This device includes the following protection against latent faults: • Boot-time Memory Built-In Self-Test (MBIST) • Boot-time scan-based Logic Built-In Self-Test (LBIST) • Run-time ADC Built-In Self-Test (BIST) • Run-time Built-In Self Test of LVDs |
|
링크 URL |
| ALLDATASHEET 가 귀하에 도움이 되셨나요? [ DONATE ] |
Alldatasheet는? | 광고문의 | 운영자에게 연락하기 | 개인정보취급방침 | 링크 투 데이터시트 | 링크교환 | 제조사별 검색 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |