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MFRC63002R 데이터시트(PDF) 24 Page - NXP Semiconductors

부품명 MFRC63002R
상세설명  Contactless reader IC
PDF  118 Pages
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제조업체  NXP [NXP Semiconductors]
홈페이지  http://www.nxp.com
Logo NXP - NXP Semiconductors

MFRC63002R 데이터시트(HTML) 24 Page - NXP Semiconductors

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MFRC630
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2012. All rights reserved.
Product data sheet
COMPANY PUBLIC
Rev. 3.1 — 6 September 2012
227531
24 of 118
NXP Semiconductors
MFRC630
Contactless reader IC
8.4.5.2
SAM connection
The MFRC630 provides an interface to connect a SAM dedicated to the MFRC630. Both
interface options of the MFRC630, I2C or I2CL can be used for this purpose. The interface
option of the SAM itself is configured by a host command sent from the host to the SAM.
The I2CL interface is intended to be used as connection between two IC’s over a short
distance. The protocol fulfills the I2C specification, but does support a single device
connected to the bus only.
8.4.6 Boundary scan interface
The MFRC630 provides a boundary scan interface according to the IEEE 1149.1. This
interface allows to test interconnections without using physical test probes. This is done
by test cells, assigned to each pin, which override the functionality of this pin.
To be able to program the test cells, the following commands are supported:
The Standard IEEE 1149.1 describes the four basic blocks necessary to use this interface:
Test Access Port (TAP), TAP controller, TAP instruction register, TAP data register;
Fig 18. I2C interface enables convenient MIFARE SAM integration
μC
Reader
T=1
I2C
I2C
aaa-002963
SAM
AV2.6
READER
IC
Table 17.
Boundary scan command
Value
(decimal)
Command
Parameter in
Parameter out
0
bypass
-
-
1
preload
data (24)
-
1
sample
-
data (24)
2
ID code (default)
-
data (32)
3
USER code
-
data (32)
4Clamp
-
-
5HIGH Z
-
-
7
extest
data (24)
data (24)
8
interface on/off
interface (1)
-
9
register access read
address (7)
data (8)
10
register access write
address (7) - data (8)
-



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