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MFRC63002R 데이터시트(PDF) 24 Page - NXP Semiconductors |
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MFRC63002R 데이터시트(HTML) 24 Page - NXP Semiconductors |
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24 / 118 page ![]() MFRC630 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved. Product data sheet COMPANY PUBLIC Rev. 3.1 — 6 September 2012 227531 24 of 118 NXP Semiconductors MFRC630 Contactless reader IC 8.4.5.2 SAM connection The MFRC630 provides an interface to connect a SAM dedicated to the MFRC630. Both interface options of the MFRC630, I2C or I2CL can be used for this purpose. The interface option of the SAM itself is configured by a host command sent from the host to the SAM. The I2CL interface is intended to be used as connection between two IC’s over a short distance. The protocol fulfills the I2C specification, but does support a single device connected to the bus only. 8.4.6 Boundary scan interface The MFRC630 provides a boundary scan interface according to the IEEE 1149.1. This interface allows to test interconnections without using physical test probes. This is done by test cells, assigned to each pin, which override the functionality of this pin. To be able to program the test cells, the following commands are supported: The Standard IEEE 1149.1 describes the four basic blocks necessary to use this interface: Test Access Port (TAP), TAP controller, TAP instruction register, TAP data register; Fig 18. I2C interface enables convenient MIFARE SAM integration μC Reader T=1 I2C I2C aaa-002963 SAM AV2.6 READER IC Table 17. Boundary scan command Value (decimal) Command Parameter in Parameter out 0 bypass - - 1 preload data (24) - 1 sample - data (24) 2 ID code (default) - data (32) 3 USER code - data (32) 4Clamp - - 5HIGH Z - - 7 extest data (24) data (24) 8 interface on/off interface (1) - 9 register access read address (7) data (8) 10 register access write address (7) - data (8) - |
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