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4256BWP 데이터시트(PDF) 25 Page - STMicroelectronics

부품명 4256BWP
상세설명  256-Kbit serial I²C bus EEPROM
PDF  41 Pages
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제조업체  STMICROELECTRONICS [STMicroelectronics]
홈페이지  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

4256BWP 데이터시트(HTML) 25 Page - STMicroelectronics

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M24256-BW M24256-BR M24256-BF M24256-DR M24256-DF
DC and AC parameters
Doc ID 6757 Rev 28
25/41
Table 10.
Input parameters
Symbol
Parameter(1)
1.
Characterized only, not tested in production.
Test condition
Min.
Max.
Unit
CIN
Input capacitance (SDA)
-
8
pF
CIN
Input capacitance (other pins)
-
6
pF
ZL
Input impedance (E2, E1, E0, WC)(2)
2.
E2, E1, E0 input impedance when the memory is selected (after a Start condition).
VIN < 0.3 VCC
30
-
k
Ω
ZH
VIN > 0.7 VCC
500
-
k
Ω
Table 11.
Cycling performance by groups of four bytes
Symbol
Parameter
Test condition(1)
1.
Cycling performance for products identified by process letter KB.
Max.
Unit
Ncycle
Write cycle
endurance(2)
2.
The Write cycle endurance is defined for groups of four data bytes located at addresses [4*N, 4*N+1,
4*N+2, 4*N+3] where N is an integer. The Write cycle endurance is defined by characterization and
qualification.
TA
≤ 25 °C, VCC(min) < VCC < VCC(max)
4,000,000
Write cycle(3)
3.
A Write cycle is executed when either a Page Write, a Byte Write, a Write Identification Page or a Lock
Identification Page instruction is decoded. When using the Byte Write, the Page Write or the Write
Identification Page, refer also to Section 5.1.5: ECC (Error Correction Code) and Write cycling.
TA = 85 °C, VCC(min) < VCC < VCC(max)
1,200,000
Table 12.
Memory cell data retention
Parameter
Test condition
Min.
Unit
Data retention(1)
1.
For products identified by process letter K. The data retention behavior is checked in production. The 200-
year limit is defined from characterization and qualification results.
TA = 55 °C
200
Year



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