AF512UDI datasheet(9/91 Pages) ETC1

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Revision 3.3

ATP Industrial Grade microSD Card Specification

2.3 Data Retention

512MB/4GB

Endurance Used

Number of P/E Cycles Used

(block level)

Corresponding Data Retention at

25C use condition

10% P/E cycles

6,000 Cycles

10 years

100% P/E cycles

60,000 Cycles

1 year

1GB/2GB

Endurance Used

Number of P/E Cycles Used

(block level)

Corresponding Data Retention at

25C use condition

10% P/E cycles

10,000 Cycles

10 years

100% P/E cycles

100,000 Cycles

1 year

Table 2-3: Data Retention

Note 1: Data retention refers to the ability of a memory bit to retain its data state over a period of time after the

data is written in NAND Flash regardless of whether the part is powered on or powered off.

A data retention failure is when there is at least 1 bit of data that cannot be read or is read incorrectly.

Note 2: NAND Flash suppliers refer to JEDEC JESD47 & JESD22 for Data Retention testing.

Based on the information provided by NAND Flash suppliers, ATP targets Data Retention as above table for

reference.

2.4 Performance

Model P/N

Seq. Read

(KB/s)

Seq. Write

(KB/s)

Random Read

(KB/s)

Random Write

(KB/s)

AF512UDI-5ACXX

19579

14998

17855

5078

AF1GUDI-5ACXX

18858

17017

17123

5393

AF2GUDI-5ACXX

18858

16377

17009

5956

AF4GUDI-5ABXX

20469

18720

18196

6081

Note: Tested by HDBench 3.40 beta 6 with 40MB file size. The performance may vary depending on the configuration,

firmware, setting, application and test environment.

Table 2-4: Performance

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Soolluuttiioonn!!

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