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MACH211SP-7VC 데이터시트(PDF) 29 Page - Advanced Micro Devices |
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MACH211SP-7VC 데이터시트(HTML) 29 Page - Advanced Micro Devices |
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29 / 37 page ![]() MACH211SP-7/10/12/15/20 29 ENDURANCE CHARACTERISTICS The MACH families are manufactured using AMD’s ad- vanced Electrically Erasable process. This technology uses an EE cell to replace the fuse link used in bipolar parts. As a result, the device can be erased and repro- grammed, a feature which allows 100% testing at the factory. Endurance Characteristics Parameter Symbol Parameter Description Min Units Test Conditions tDR Min Pattern Data Retention Time 10 Years Max Storage Temperature 20 Years Max Operating Temperature N Max Reprogramming Cycles 100 Cycles Normal Programming Conditions |
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