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STM32F217VG 데이터시트(PDF) 95 Page - STMicroelectronics |
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STM32F217VG 데이터시트(HTML) 95 Page - STMicroelectronics |
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95 / 173 page ![]() STM32F21xxx Electrical characteristics Doc ID 17050 Rev 8 95/173 5.3.16 I/O port characteristics General input/output characteristics Unless otherwise specified, the parameters given in Table 43 are derived from tests performed under the conditions summarized in Table 11. All I/Os are CMOS and TTL compliant. Table 43. I/O static characteristics Symbol Parameter Conditions Min Typ Max Unit VIL Input low level voltage TTL ports 2.7 V ≤ VDD ≤ 3.6 V VSS–0.3 - 0.8 V VIH (1) TT(2) I/O input high level voltage 2.0 - VDD+0.3 FT(3) I/O input high level voltage 2.0 - 5.5 VIL Input low level voltage CMOS ports 1.8 V ≤ VDD ≤ 3.6 V VSS–0.3 - 0.3VDD VIH (1) TT I/O input high level voltage 0.7VDD -3.6(4) FT I/O input high level voltage -5.2(4) CMOS ports 2.0 V ≤ VDD ≤ 3.6 V -5.5(4) Vhys I/O Schmitt trigger voltage hysteresis(5) -200 - mV IO FT Schmitt trigger voltage hysteresis(5) 5% VDD (4) - - Ilkg I/O input leakage current (6) VSS ≤ VIN ≤ VDD -- ±1 µA I/O FT input leakage current (6) VIN = 5 V - - 3 RPU Weak pull-up equivalent resistor(7) All pins except for PA10 and PB12 VIN = VSS 30 40 50 k Ω PA10 and PB12 811 15 RPD Weak pull-down equivalent resistor All pins except for PA10 and PB12 VIN = VDD 30 40 50 PA10 and PB12 811 15 CIO (8) I/O pin capacitance 5 pF 1. If VIH maximum value cannot be respected, the injection current must be limited externally to IINJ(PIN) maximum value. 2. TT = 3.6 V tolerant. 3. FT = 5 V tolerant. 4. With a minimum of 100 mV. 5. Hysteresis voltage between Schmitt trigger switching levels. Based on characterization, not tested in production. 6. Leakage could be higher than the maximum value, if negative current is injected on adjacent pins. 7. Pull-up and pull-down resistors are designed with a true resistance in series with a switchable PMOS/NMOS. This MOS/NMOS contribution to the series resistance is minimum (~10% order) . 8. Guaranteed by design, not tested in production. |
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