LM35

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SNIS159D – AUGUST 1999 – REVISED OCTOBER 2013

ABSOLUTE MAXIMUM RATINGS

(1) (2)

MIN

MAX

UNIT

Supply voltage

–0.2

35

V

Output voltage

–1

6

V

Output current

10

mA

2500

V

Storage temperature

TO Package

–60

180

TO-92 Package

–60

150

°C

TO-220 Package

–65

150

SOIC-8 Package

–65

150

Lead temperature

TO Package (soldering, 10 seconds)

300

TO-92 and TO-220 Package (soldering, 10 seconds)

260

°C

SOIC Package

Infrared (15 seconds)

220

Vapor phase (60 seconds)

215

Specified operating temperature LM35, LM35A

–55

150

(4)

LM35C, LM35CA

–40

110

°C

LM35D

0

100

(1)

If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and

specifications.

(2)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not

apply when operating the device beyond its rated operating conditions. See Note 1.

(3)

Human body model, 100 pF discharged through a 1.5-k

Ω resistor.

(4)

Thermal resistance of the TO-46 package is 400°C/W, junction to ambient, and 24°C/W junction to case. Thermal resistance of the TO-

92 package is 180°C/W junction to ambient. Thermal resistance of the small outline molded package is 220°C/W junction to ambient.

Thermal resistance of the TO-220 package is 90°C/W junction to ambient. For additional thermal resistance information see table in the

APPLICATIONS section.

ELECTRICAL CHARACTERISTICS

(1) (2)

LM35A

LM35CA

UNITS

PARAMETER

TEST CONDITIONS

TYP

TESTED

DESIGN

TYP

TESTED

DESIGN

(MAX.)

±0.2

±0.5

±0.2

±0.5

±0.3

±0.3

±1

°C

±0.4

±1

±0.4

±1

±0.4

±1

±0.4

±1.5

±0.18

±0.35

±0.15

±0.3

°C

Sensor gain

+10

+9.9,

+10

+9.9,

mV/°C

(average slope)

+10.1

+10.1

±0.4

±1

±0.4

±1

mV/mA

0

±0.5

±3

±0.5

±3

±0.01

±0.05

±0.01

±0.05

mV/V

4 V

±0.02

±0.1

±0.02

±0.1

(1)

Unless otherwise noted, these specifications apply:

and LM35CA; and 0°C

(2)

Specifications in boldface apply over the full rated temperature range.

(3)

Tested Limits are ensured and 100% tested in production.

(4)

Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are

not used to calculate outgoing quality levels.

(5)

Accuracy is defined as the error between the output voltage and 10 mv/°C times the case temperature of the device, at specified

conditions of voltage, current, and temperature (expressed in °C).

(6)

Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated

temperature range of the device.

(7)

Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating

effects can be computed by multiplying the internal dissipation by the thermal resistance.

Copyright © 1999–2013, Texas Instruments Incorporated

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