LM35CZ datasheet(4/29 Pages) TI1

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LM35

SNIS159D – AUGUST 1999 – REVISED OCTOBER 2013

www.ti.com

ELECTRICAL CHARACTERISTICS

(1)(2) (continued)

LM35A

LM35CA

UNITS

PARAMETER

TEST CONDITIONS

TYP

TESTED

DESIGN

TYP

TESTED

DESIGN

(MAX.)

LIMIT(3)

LIMIT(4)

LIMIT(3)

LIMIT(4)

VS = 5 V, 25°C

VS = 5 V

105

131

114

Quiescent current(8)

µA

VS = 30 V, 25°C

56.2

VS = 30 V

105.5

133

91.5

116

4 V

≤ VS ≤ 30 V, 25°C

0.2

Change of quiescent

µA

current(7)

4 V

≤ VS ≤ 30 V

0.5

Temperature

+0.39

+0.5

+0.39

+0.5

coefficient of

µA/°C

quiescent current

Minimum temperature

In circuit of Figure 1, IL = 0

+1.5

°C

for rate accuracy

Long term stability

TJ = TMAX, for 1000 hours

±0.08

°C

(8)

Quiescent current is defined in the circuit of Figure 1.

ELECTRICAL CHARACTERISTICS

(1) (2)

LM35

LM35C, LM35D

UNITS

PARAMETER

TEST CONDITIONS

TYP

TESTED

DESIGN

TYP

TESTED

DESIGN

(MAX.)

LIMIT(3)

LIMIT(4)

LIMIT(3)

LIMIT(4)

TA = 25°C

±0.4

±1

±0.4

±1

TA = –10°C

±0.5

±1.5

Accuracy, LM35,

°C

LM35C(5)

TA = TMAX

±0.8

±1.5

±0.8

±1.5

TA = TMIN

±0.8

±1.5

±0.8

±2

TA = 25°C

±0.6

±1.5

Accuracy, LM35D(5)

TA = TMAX

±0.9

±2

°C

TA = TMIN

±0.9

±2

Nonlinearity(6)

TMIN ≤ TA ≤ TMAX

±0.3

±0.5

±0.2

±0.5

°C

Sensor gain

TMIN ≤ TA ≤ TMAX

+10

+9.8,

+10

+9.8,

mV/°C

(average slope)

+10.2

TA = 25°C

±0.4

±2

±0.4

±2

Load regulation(7)

mV/mA

≤ IL ≤ 1 mA

TMIN ≤ TA ≤ TMAX

±0.5

±5

±0.5

±5

TA = 25°C

±0.01

±0.1

±0.01

±0.1

Line regulation(7)

mV/V

4 V

≤ VS ≤ 30 V

±0.02

±0.2

±0.02

±0.2

(1)

Unless otherwise noted, these specifications apply:

−55°C ≤ TJ ≤ 150°C for the LM35 and LM35A; −40°C ≤ TJ ≤ 110°C for the LM35C

and LM35CA; and 0°C

≤ TJ ≤ 100°C for the LM35D. VS = 5 Vdc and ILOAD = 50 μA, in the circuit of Figure 2. These specifications also

apply from +2°C to TMAX in the circuit of Figure 1. Specifications in boldface apply over the full rated temperature range.

(2)

Specifications in boldface apply over the full rated temperature range.

(3)

Tested Limits are ensured and 100% tested in production.

(4)

Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are

not used to calculate outgoing quality levels.

(5)

Accuracy is defined as the error between the output voltage and 10 mv/°C times the case temperature of the device, at specified

conditions of voltage, current, and temperature (expressed in °C).

(6)

Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated

temperature range of the device.

(7)

Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating

effects can be computed by multiplying the internal dissipation by the thermal resistance.

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