| 전자부품 데이터시트 검색엔진 |
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AT45DB321E 데이터시트(PDF) 49 Page - List of Unclassifed Manufacturers |
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AT45DB321E 데이터시트(HTML) 49 Page - List of Unclassifed Manufacturers |
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49 / 73 page ![]() AC Driving Levels AC Measurement Level 0.1V CC V CC/2 0.9V CC tR, tF < 2ns (10% to 90%) 49 AT45DB321E 8784F–DFLASH–11/2013 18.5 Program and Erase Characteristics Notes: 1. Values are based on device characterization, not 100% tested in production. 2. Not 100% tested (value guaranteed by design and characterization). 19. Input Test Waveforms and Measurement Levels 20. Output Test Load Symbol Parameter Min Typ Max Units tEP Page Erase and Programming Time (512/528 bytes) 17 35 ms tP Page Programming Time 3 4 ms tBP Byte Programming Time 8 μs tPE Page Erase Time 12 35 ms tBE Block Erase Time 45 100 ms tSE Sector Erase Time 0.7 1.4 s tCE Chip Erase Time 45 80 s tSUSP Suspend Time Program 10 15 μs Erase 20 30 tRES Resume Time Program 10 15 μs Erase 20 30 tOTPP OTP Security Register Program Time 200 500 μs Device Under Test 30pF |
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