| 전자부품 데이터시트 검색엔진 |
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AT697F 데이터시트(PDF) 9 Page - ATMEL Corporation |
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AT697F 데이터시트(HTML) 9 Page - ATMEL Corporation |
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9 / 176 page ![]() 9 AT697F 7703E–AERO–08/11 TMS - Test Mode select (input with pull-up) This synchronous input is used to control the state of the TAP controller in the device. TDI - Test data input (input with pull-up) This input is used to serially shift test data and test instructions into the device during TAP operation. TDO - Test data output (tri-statable output with pull-up) This input is used to serially shift test data and test instructions out of the device during TAP operation. Power Supply VCC33 - I/O power (supply) Power supply for the I/O pins. VSS33 - I/O ground (supply) Ground supply for the I/O pins. VDD18 - Core power (supply) Power supply for the processor core. VSS18 - Core ground (supply) Ground supply for the processor core. VDD_PLL - PLL power (supply) Power supply for the PLL. VSS_PLL - PLL ground (supply) Ground supply for the PLL. |
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