ADVANCE INFORMATION

13

8x930Ax UNIVERSAL SERIAL BUS (USB) MICROCONTROLLER

5.2

DC Characteristics

Table 9. DC Characteristics at Operating Conditions

Symbol

Parameter

Min

Typical (1)

Max

Units

Test Conditions

V

IL

Input Low Voltage

(Except EA#)

-0.5

0.2 V

V

V

IL

1

Input Low Voltage

(EA#)

00.2 V

V

V

IH

Input High Voltage

(Except XTAL1, RST)

0.2 V

V

V

V

IH

1

Input High Voltage

(XTAL1, RST)

0.7 V

CC

V

V

V

OL

Output Low Voltage

(Port 1, 2, 3)

0.3

0.45

1.0

V

I

I

I

V

OL

1

Output Low Voltage

(Port 0, ALE, PSEN#,

SOF#)

0.3

0.45

1.0

V

I

I

I

V

OH

Output High Voltage

(Port 1, 2, 3,ALE,

PSEN#, SOF#)

V

V

V

V

I

I

I

V

OH

1

Output High Voltage

(Port 0 in External

Address)

V

V

V

V

I

I

I

I

IL

Logical 0 Input

Current (Port 1,2,3)

–150

µA

V

I

LI

Input Leakage Current

(Port 0)

±10

µA

0.45 < V

NOTE:

1.

Typical values are obtained using V

2.

Under steady state (non-transient) conditions, I

Maximum I

Maximum I

Port 0: 26 mA

Ports 1-3: 15 mA

Maximum Total I

If I

to sink current greater than the listed test conditions.

3.

Capacitive loading on Ports 0 and 2 may cause spurious noise pulses above 0.4 V on the low-level

outputs of ALE and Ports 1, 2 and 3. The noise is due to external bus capacitance discharging into the

Port 0 and Port 2 pins when these pins change from 1 to 0. In applications where capacitive loading

exceeds 100pF, the noise pulses on these signals may exceed 0.8 V. It may be desirable to qualify

ALE or other signals with a Schmitt Trigger or CMOS-level input logic.

4.

Capacitive loading on Ports 0 and 2 cause the V

tion when the address lines are stabilizing.

5.

The abbreviations “LS” and “FS” indicate “Low Speed” and “Full Speed,” respectively.