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AN4253 데이터시트(PDF) 16 Page - STMicroelectronics

부품명 AN4253
상세설명  SPC564Lx device startup flow
PDF  44 Pages
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제조업체  STMICROELECTRONICS [STMicroelectronics]
홈페이지  http://www.st.com
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AN4253 데이터시트(HTML) 16 Page - STMicroelectronics

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RGM block
AN4253
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DocID024255 Rev 2
5.1.1
Code sequence
1.
32b read from RGM address 0xC3FE4000
5.2
POR/destructive/external reset check
POR, destructive and external resets are destructive to RAM memory content. It means that
the entire RAM memory must be initialized in the startup.
External reset is destructive only if STCU BIST tests are enabled. If STCU built–in self test
is not used, external reset can be omitted from the check.
5.2.1
Code sequence
1.
Do AND operation between read FES_DES value and mask 0x8000FFFF
2.
If the result != 0x0 > destructive reset, RAM corrupted
5.3
Expected functional reset
This analysis is application specific as some reset can be used from the application to
change the mode of the ECU.
In most cases the startup analysis requires additional information from the application to
decide if the reset was expected or unexpected. One possibility is to use a small RAM
memory block that serves as non-volatile storage, valid only if the reset is functional one.
5.4
User specific code for given expected reset
If the reset was expected the user provides the necessary startup code. In most case it can
be by setting special flags or to set appropriate values in the non-volatile RAM block.
5.5
Save reset flags
Similar to FCCU save operation:
•
Non-volatile RAM is used to exchange data between the startup code and the
application. In case of a destructive reset the entire memory will be cleared.
•
One of the core registers like SPRGx. These registers are usually used by the
application or operating system for non specific purposes.
5.6
Clear reset flags
Reset flags are cleared with write-‘1’-to-clear operation to RGM base address (FES+DES
registers).A clear operation is needed in case the microcontroller is in safe state to enable
mode entry transition.



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