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AN4266 데이터시트(PDF) 39 Page - STMicroelectronics

부품명 AN4266
상세설명  Safety application guide for SPC56xL70xx family
PDF  76 Pages
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제조업체  STMICROELECTRONICS [STMicroelectronics]
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AN4266 데이터시트(HTML) 39 Page - STMicroelectronics

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AN4266
Functional safety requirements for application software
Doc ID 024283 Rev 2
39/76
Figure 8.
Single Read Analog Input configuration
Hardware BIST
Three types of self-test algorithms have been implemented in the ADC hardware:
●
SUPPLY SELF-TEST
●
RESISTIVE-CAPACITIVE SELF-TEST
●
CAPACITIVE SELF-TEST
Hardware BIST implementationThe hardware BISTs shall be activated by the application in
one of the following modes:
●
CPU mode
●
CTU mode
In CPU mode, the application software takes care of the hardware self-test activation and
checks the test flow and the timing.
In CTU mode, the CTU module takes care of the hardware self-test activation, flow
monitoring, and timing. It is important to note that in this operating mode, the CPU does not
take part in running the hardware self-test.
HW self-tests use analog watchdogs to verify the outcome of self-test conversions. The
reference thresholds of these watchdogs are saved in test sector (See “Test flash memory”
section and “Test flash information” table in the SPC56xL70xx Reference Manual).
Mandatory: Before running the HW self-test, the customer must copy these thresholds from
the test sector into the watchdog registers (See “Self test analog watchdog” section of the
SPC56xL70xx Reference Manual).
ADC_x
Analog Single Read/Write Internal
Readback Configuration
AN[x]
Reference voltages
(Vdd_HV_ADRx and Vss_HV_ADR)
I
I
= Input Pad



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