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TN0897 데이터시트(PDF) 22 Page - STMicroelectronics |
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TN0897 데이터시트(HTML) 22 Page - STMicroelectronics |
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22 / 28 page ![]() Read and clear status operation TN0897 22/28 Doc ID 023176 Rev 2 6.2 Format of data shifted out at SDO during read and clear status operation Figure 12. SDO Frame composition during READ and CLEAR operation Failures are indicated by activating the corresponding bit of the <Global Status> register. The returned data byte(s) represent(s) the content of the register to be read. Figure 13. Read and clear status operation - 16 bit frame Global status register Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 Global Error Flag (GEF) Comm Error Not (Chip Reset OR Comm Error) TSD / chip overload Tframe Device specific Device specific Fail Safe Data byte 1 - content of addressed status register or configuration register MSB LSB D7 D6 D5 D4 D3 D2 D1 D0 Data byte 2 - content of addressed status register(1) 1. Only for 24-bit SPI frame width. MSB LSB D7 D6 D5 D4 D3 D2 D1 D0 0 0 0 0 0 0 0 0 A0 A1 A2 A3 A4 A5 0 1 CSN SDI Command D0 D1 D2 D3 D4 D5 D6 D7 Fail Safe Dev spec Dev spec Tframe TSD / Chip OVL NOT (Chip Res OR Comm Err) Com Error GEF SDO Global Status Content of addressed status register or ‚Configuration’ Register (8 bit) GAPGCFT00724 |
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