| 전자부품 데이터시트 검색엔진 |
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DIM800DDS12-A000 데이터시트(PDF) 4 Page - Dynex Semiconductor |
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DIM800DDS12-A000 데이터시트(HTML) 4 Page - Dynex Semiconductor |
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4 / 8 page ![]() DIM800DDS12-A000 4/8 Caution: This device is sensitive to electrostatic discharge. Users should follow ESD handling procedures. www.dynexsemi.com ELECTRICAL CHARACTERISTICS Tcase = 25°C unless stated otherwise Symbol Parameter Test Conditions Min Typ. Max Units td(off) Turn-off delay time IC = 800A VGE = ±15V VCE = 600V RG(ON) = 2.7 RG(OFF) = 2.7 LS ~ 100nH 1250 ns tf Fall time 170 ns EOFF Turn-off energy loss 130 mJ td(on) Turn-on delay time 250 ns tr Rise time 250 ns EON Turn-on energy loss 80 mJ Qrr Diode reverse recovery charge IF = 800A VCE = 600V dIF/dt = 4200A/μs 80 μC Irr Diode reverse recovery current 380 A Erec Diode reverse recovery energy 30 mJ Tcase = 125°C unless stated otherwise Symbol Parameter Test Conditions Min Typ. Max Units td(off) Turn-off delay time IC = 800A VGE = ±15V VCE = 600V RG(ON) = 2.7 RG(OFF) = 2.7 LS ~ 100nH 1500 ns tf Fall time 200 ns EOFF Turn-off energy loss 160 mJ td(on) Turn-on delay time 400 ns tr Rise time 220 ns EON Turn-on energy loss 120 mJ Qrr Diode reverse recovery charge IF = 800A VCE = 600V dIF/dt = 4000A/μs 160 μC Irr Diode reverse recovery current 450 A Erec Diode reverse recovery energy 60 mJ |
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