AN3169

IEC 61000-4-4 Tests

Doc ID 17194 Rev 1

9/12

Figure 8.

Product rankings in IEC 61000-4-4 tests

2.4

Sensitivity impact

According to previous results, it is difficult to conclude anything about impact of device

sensitivity on immunity. We have even seen that some devices with good dV/dt capability

can present poor immunity level. But, such a conclusion is difficult to sustain because we

have compared here components from different processes.

To better analyze the sensitivity impact, we have also performed some tests of other Triacs

coming from the same process. We took some T405-800 devices which are manufactured

approximately half those of the T410 devices we have tested, and this for the three

1.75 mA respectively for quadrants 1, 2 and 3. The maximum burst level that these devices

were able to withstand was around 1 kV, i.e. 30% lower than the T410-800. This result

highlights that sensitivity has also a strong impact on immunity, as is well known. But this

statement is only valid if one compares two devices from the same process.

0

0.5

1

1.5

2

2.5

3

3.5

4

4.5

Max burst levels (kV)

COMP.2A

COMP.1A

Z0409N

T410-800

ACST2