 |
전자부품 데이터시트 검색엔진 |
|
|
전자부품 데이터시트 검색엔진 |
|
AN3307 데이터시트(PDF) 11 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
AN3307 데이터시트(HTML) 11 Page - STMicroelectronics |
|
|
11 / 37 page  AN3307 Compliance with IEC and VDE standards Doc ID 18186 Rev 4 11/37 3.1 Generic tests included in the STM32Fxxx firmware library The certified by VDE STM32Fxxx firmware library packages are composed of the following micro-specific software modules: ● CPU register test ● Clock monitoring ● RAM functional check ● Flash checksum integrity check ● Watchdog self-test ● Stack overflow monitoring An overview of the methods used for these MCU-specific tests is given in Table 2 and they are described in more detail in the following chapters. The last two items from the list above are not explicitly asked for by the norm, but they improve overall fault coverage. Table 1. MCU parts which must be tested for Class B compliance Group Components to be tested Micro-specific CPU registers CPU program counter Clock Volatile & non-volatile memories Internal addressing (and external memory addressing if any) Internal data path Application-specific Interrupt handling External communication Timing I/O peripherals Analog A/D and D/A Analog multiplexer |
|
링크 URL |
| ALLDATASHEET 가 귀하에 도움이 되셨나요? [ DONATE ] |
Alldatasheet는? | 광고문의 | 운영자에게 연락하기 | 개인정보취급방침 | 링크 투 데이터시트 | 링크교환 | 제조사별 검색 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |
Korean ▼
English
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
Indian
Mexican
British
New Zealand
