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AN4494 데이터시트(PDF) 18 Page - STMicroelectronics |
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AN4494 데이터시트(HTML) 18 Page - STMicroelectronics |
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18 / 34 page ![]() IFR configuration AN4494 4.6 Expected results The measured value must be compensated in order to consider the variations of the power supply, temperature and the crystal tolerance: XTAL_startup = XTAL_startup(measured)*1.2*1.1*1.2 = 1.584* XTAL_startup (measured) The first coefficient (1.2) can be omitted if the test is performed at the minimum operative voltage. Finally, to find the HS_STARTUP_TIME value that must be set up in the IFR, use this formula: HS_STARTUP_TIME = 110 µs + MAX {XTAL_startup, (0.56*XTAL_startup+304)} 4.7 Note Examples: XTAL_startup = 300 µs → HS_STARTUP_TIME = 680 µs XTAL_startup = 700 µs → HS_STARTUP_TIME = 1219 µs 4.8 Other N/A. 18/34 DocID026361 Rev 3 |
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