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74HC_HCT4053 데이터시트(PDF) 13 Page - NXP Semiconductors |
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74HC_HCT4053 데이터시트(HTML) 13 Page - NXP Semiconductors |
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13 / 32 page ![]() 74HC_HCT4053 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved. Product data sheet Rev. 8 — 19 July 2012 13 of 32 NXP Semiconductors 74HC4053; 74HCT4053 Triple 2-channel analog multiplexer/demultiplexer 11. Dynamic characteristics Vis = VCC and Vos = VEE. Vis = VEE and Vos = VCC. Fig 11. Test circuit for measuring OFF-state current 001aah827 nYn Sn from select input nZ GND VEE VCC Vis Vos Isw A Isw A Vis = VCC and Vos = open-circuit. Vis = VEE and Vos = open-circuit. Fig 12. Test circuit for measuring ON-state current Isw A 001aah828 nYn Sn HIGH from select input nZ GND VEE VCC Vis Vos Table 9. Dynamic characteristics for 74HC4053 GND = 0 V; tr =tf =6ns; CL = 50 pF; for test circuit see Figure 15. Vis is the input voltage at a nYn or nZ terminal, whichever is assigned as an input. Vos is the output voltage at a nYn or nZ terminal, whichever is assigned as an output. Symbol Parameter Conditions Min Typ Max Unit Tamb =25 C tpd propagation delay Vis to Vos; RL = ; see Figure 13 [1] VCC = 2.0 V; VEE = 0 V - 15 60 ns VCC = 4.5 V; VEE =0 V - 5 12 ns VCC = 6.0 V; VEE =0 V - 4 10 ns VCC = 4.5 V; VEE = 4.5 V - 4 8 ns |
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