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DM385 데이터시트(PDF) 123 Page - Texas Instruments |
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DM385 데이터시트(HTML) 123 Page - Texas Instruments |
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123 / 281 page ![]() DM385, DM388 www.ti.com SPRS821D – MARCH 2013 – REVISED DECEMBER 2013 6 Device Operating Conditions 6.1 Absolute Maximum Ratings (1) (2) Core (CVDD, CVDD_ARM, CVDD_HDVICP) -0.3 V to 1.5 V HD-DAC Digital Logic, 1.1V (VDDA_HDDAC_1P1) -0.5 V to 1.5 V I/O, 1.8 V (DVDD_DDR[0], VDDA_1P8, VDDA_ARMPLL_1P8, -0.3 V to 2.1 V VDDA_VIDPLL_1P8, VDDA_AUDIOPLL_1P8, VDDA_DDRPLL_1P8, Supply voltage ranges (Steady VDDA_L3L4PLL_1P8, VDDA_PCIE_1P8, VDDA_HDMI_1P8, State): VDDA_USB0_1P8, VDDA_USB1_1P8, VDDA_VDAC_1P8, VDDA_CSI2_1P8, VDDA_HDDACREF_1P8, VDDA_HDDAC_1P8, VDDA_HDVICPPLL_1P8, VDDS_OSC0_1P8, VDDS_OSC1_1P8 I/O 3.3 V (DVDD, DVDD_GPMC, DVDD_RGMII, DVDD_SD, DVDD_C) -0.3 V to 4.0 V DDR Reference Voltage (VREFSSTL_DDR[0]) -0.3 V to 1.1 V V I/O, 1.35-V pins (Steady State) -0.3 V to DVDD_DDR[0] + 0.3 V V I/O, 1.35-V pins (Transient Overshoot/Undershoot) 30% of DVDD_DDR[0] for up to 30% of the signal period V I/O, 1.5-V pins (Steady State) -0.3 V to DVDD_DDR[0] + 0.3 V V I/O, 1.5-V pins (Transient Overshoot/Undershoot) 30% of DVDD_DDR[0] for up to 30% of the signal Input and Output voltage ranges: period V I/O, 1.8-V pins (Steady State) -0.3 V to DVDD + 0.3 V -0.3 V to DVDD_x + 0.3 V V I/O, 1.8-V pins (Transient Overshoot/Undershoot) 25% of DVDDx for up to 30% of the signal period V I/O, 3.3-V pins (Steady State) -0.3 V to DVDD + 0.3 V -0.3 V to DVDD_x + 0.3 V V I/O, 3.3-V pins (Transient Overshoot/Undershoot) 25% of DVDDx for up to 30% of the signal period Operating junction temperature Commercial Temperature (default) 0°C to 95°C range, TJ: Extended temperature -40°C to 95°C Storage temperature range, Tstg: -55°C to 150°C Component-Level ESD-HBM (Human Body Model)(4) ±1000 V Electrostatic Discharge (ESD) ESD-CDM (Charged-Device Model)(5) ±250 V Stress Voltage(3) Latch-up Performance(6) Class II (105ºC) 50 mA (1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) All voltage values are with respect to their associated VSS or VSSA_x. (3) Electrostatic discharge (ESD) to measure device sensitivity or immunity to damage caused by electrostatic discharges into the device. (4) Level listed is the passing level per ANSI/ESDA/JEDEC JS-001. JEDEC document JEP155 states that 500 V HBM allows safe manufacturing with a standard ESD control process, and manufacturing with less than 500 V HBM is possible if necessary precautions are taken. Pins listed as 1000 V may actually have higher performance. (5) Level listed is the passing level per EIA-JEDEC JESD22-C101E. JEDEC document JEP157 states that 250 V CDM allows safe manufacturing with a standard ESD control process, and manufacturing with less than 250 V CDM is possible if necessary precautions are taken. Pins listed as 250 V may actually have higher performance. (6) Based on JEDEC JESD78D [IC Latch-Up Test]. Copyright © 2013, Texas Instruments Incorporated Device Operating Conditions 123 Submit Documentation Feedback Product Folder Links: DM385 DM388 |
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