NX3L4053

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© NXP B.V. 2012. All rights reserved.

Product data sheet

Rev. 5 — 25 June 2012

12 of 22

NXP Semiconductors

NX3L4053

Triple low-ohmic single-pole double-throw analog switch

a. Test circuit

b. Input and output measurement points

Fig 16. Test circuit for measuring break-before-make timing

V

001aal743

E

nY0

nY1

nS

GND

nZ

G

VEXT = 1.5 V

VI

VO

CL

RL

001aag572

Test data is given in Table 11.

Definitions test circuit:

Fig 17. Test circuit for measuring switching times

V

001aal744

E

nY0

nY1

nS

GND

nZ

G

VEXT = 1.5 V

VI

VO

CL

RL

switch

1

2