NX3L4053

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© NXP B.V. 2012. All rights reserved.

Product data sheet

Rev. 5 — 25 June 2012

14 of 22

NXP Semiconductors

NX3L4053

Triple low-ohmic single-pole double-throw analog switch

12.3 Test circuits

Fig 18. Test circuit for measuring total harmonic distortion

D

001aal745

E

nY0

nY1

nS

GND

nZ

switch

1

2

nS

switch

1

2

E

RL

fi

Fig 19. Test circuit for measuring the frequency response when channel is in ON-state

dB

001aal746

E

nY0

nY1

nS

GND

nZ

switch

1

2

nS

switch

1

2

E

RL

fi

Fig 20. Test circuit for measuring isolation (OFF-state)

dB

001aal747

E

nY0

nY1

nS

GND

nZ

switch

1

2

nS

switch

1

2

E

RL

RL

fi