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STM32F401 데이터시트(PDF) 108 Page - STMicroelectronics

부품명 STM32F401
상세설명  Up to 12 communication interfaces
PDF  135 Pages
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제조업체  STMICROELECTRONICS [STMicroelectronics]
홈페이지  http://www.st.com
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STM32F401 데이터시트(HTML) 108 Page - STMicroelectronics

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Electrical characteristics
STM32F401xD STM32F401xE
108/135
The formula above (Equation 1) is used to determine the maximum external impedance
allowed for an error below 1/4 of LSB. N = 12 (from 12-bit resolution) and k is the number of
sampling periods defined in the ADC_SMPR1 register.
Table 67. ADC accuracy at fADC = 18 MHz(1)
1. Better performance could be achieved in restricted VDD, frequency and temperature ranges.
Symbol
Parameter
Test conditions
Typ
Max(2)
2. Guaranteed by characterization, not tested in production.
Unit
ET
Total unadjusted error
fADC =18 MHz
VDDA = 1.7 to 3.6 V
VREF = 1.7 to 3.6 V
VDDA − VREF < 1.2 V
±3
±4
LSB
EO
Offset error
±2
±3
EG
Gain error
±1
±3
ED
Differential linearity error
±1
±2
EL
Integral linearity error
±2
±3
Table 68. ADC accuracy at fADC = 30 MHz(1)
1. Better performance could be achieved in restricted VDD, frequency and temperature ranges.
Symbol
Parameter
Test conditions
Typ
Max(2)
2. Guaranteed by characterization, not tested in production.
Unit
ET
Total unadjusted error
fADC = 30 MHz,
RAIN < 10 kΩ,
VDDA = 2.4 to 3.6 V,
VREF = 1.7 to 3.6 V,
VDDA − VREF < 1.2 V
±2
±5
LSB
EO
Offset error
±1.5
±2.5
EG
Gain error
±1.5
±4
ED
Differential linearity error
±1
±2
EL
Integral linearity error
±1.5
±3
Table 69. ADC accuracy at fADC = 36 MHz(1)
1. Better performance could be achieved in restricted VDD, frequency and temperature ranges.
Symbol
Parameter
Test conditions
Typ
Max(2)
2. Guaranteed by characterization, not tested in production.
Unit
ET
Total unadjusted error
fADC =36 MHz,
VDDA = 2.4 to 3.6 V,
VREF = 1.7 to 3.6 V
VDDA − VREF < 1.2 V
±4
±7
LSB
EO
Offset error
±2
±3
EG
Gain error
±3
±6
ED
Differential linearity error
±2
±3
EL
Integral linearity error
±3
±6



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