4

Notes:

1. Logic will not latchup during radiation exposure within the limits defined in the table.

2. Not tested, inherent of CMOS technology.

Note:

1. Stresses outside the listed absolute maximum ratings may cause permanent damage to the device. This is a stress rating only, functional operation of the device at

these or any other conditions beyond limits indicated in the operational sections is not recommended. Exposure to absolute maximum rating conditions for extended

periods may affect device reliability and performance.

RECOMMENDED OPERATING CONDITIONS

PARAMETER

LIMIT

UNITS

Total Dose

1.0E5

rads(Si)

SEU Onset LET

>108

SEL Immune

>108

1.0E14

SYMBOL

PARAMETER

LIMIT

UNITS

Supply voltage

-0.3 to 6.0

V

Voltage any pin during operation

V

Storage Temperature range

-65 to +150

C

Maximum junction temperature

+175

C



JC

Thermal resistance junction to case

20

C/W

DC input current

+10

mA

Maximum power dissipation



mW

SYMBOL

PARAMETER

LIMIT

UNITS

Supply voltage

4.5 to 5.5

V

Input voltage any pin

V

Temperature range

-55 to +125

Maximum input rise or fall time

20

ns