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UT130NHBD 데이터시트(PDF) 4 Page - Aeroflex Circuit Technology

부품명 UT130NHBD
상세설명  Hardened-by-Design (HBD) Standard Cell
PDF  8 Pages
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제조업체  AEROFLEX [Aeroflex Circuit Technology]
홈페이지  http://www.aeroflex.com
Logo AEROFLEX - Aeroflex Circuit Technology

UT130NHBD 데이터시트(HTML) 4 Page - Aeroflex Circuit Technology

  UT130NHBD Datasheet HTML 1Page - Aeroflex Circuit Technology UT130NHBD Datasheet HTML 2Page - Aeroflex Circuit Technology UT130NHBD Datasheet HTML 3Page - Aeroflex Circuit Technology UT130NHBD Datasheet HTML 4Page - Aeroflex Circuit Technology UT130NHBD Datasheet HTML 5Page - Aeroflex Circuit Technology UT130NHBD Datasheet HTML 6Page - Aeroflex Circuit Technology UT130NHBD Datasheet HTML 7Page - Aeroflex Circuit Technology UT130NHBD Datasheet HTML 8Page - Aeroflex Circuit Technology  
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configures the I/O buffers into their lowest power state. A unique Aeroflex reference circuit improves performance matching be-
tween multiple Tx buffers and multiple Rx buffers.
Aeroflex's ASIC HSTL bidirect, tristate and input buffers are based on the EIA/JEDEC Standard EIA/JESD8-6 (August 1995)
Class-1 and -2. They provide switching rates of 250MHz and all support a power-down mode.
JTAG BOUNDARY-SCAN
The UT130nHBD family allows for insertion of a test access port and boundary-scan that conforms to the IEEE Standard 1149.1
(JTAG). Some of the benefits of this capability are:
• Easy test of complex assembled printed circuit boards
• Gain access to and control of internal scan paths
• Initiation of Built-In Self Test
CLOCK DRIVER DISTRIBUTION
Aeroflex design tools provide methods for balanced clock distribution that maximize drive capability and minimize relative clock
skew between clocked devices.
SPEED AND PERFORMANCE
Aeroflex specializes in high-performance circuits designed to operate in harsh military and radiation environments.
Typically the propagation delay for a CMOS device is a function of its fanout loading, input slew, supply voltage, operating tem-
perature and processing radiation tolerance. In a radiation environment additional performance variances must be considered.
The UT130nHBD simulation models account for all of these effects to accurately determine circuit performance for its particular
set of use conditions.
POWER DISSIPATION
Power consumption of internal gates and I/O buffers is based on many factors including switching frequency, loading, voltage, tem-
perature and transistor leakage characteristics. Aeroflex's radiation-tolerant process exhibits power dissipation that is typical of
commercial CMOS processes. The UT130nHBD cell library supports a low power design methodology by providing high thresh-
old voltage VT versions of the core cells to reduce leakage current. Additionally the library contains clock gating cells that can be
used to reduce switching activity in designs. For rigorous power estimation methodology refer to the Aeroflex UT130nHBD Design
manual or consult with an Aeroflex Applications Engineer.
ASIC DESIGN SOFTWARE
Using a combination of state-of-the-art third-party and proprietary design tools Aeroflex delivers the CAE support and capability
to handle complex, high-performance ASIC designs from design concept through design verification and test.
Aeroflex's flexible circuit creation methodology supports high level design methodology by providing synthesis libraries in Liberty
syntax. Compiled technology files are provided for Synopsys synthesis and design analysis tools. Design verification is performed
in any VHDL or Verilog simulation environment using Aeroflex's robust libraries. Aeroflex also supports Automatic Test Program
Generation and Memory BIST to improve design testing.
AEROFLEX HDL DESIGN SYSTEMS
Aeroflex offers a Hardware Description Language (HDL) design system supporting both VHDL and Verilog that allows easy access
to Aeroflex's RadHard capabilities. Both the VHDL and Verilog libraries provide sign-off quality models and robust tools.



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