ADS5541IPAPR datasheet(3/37 Pages) TI1

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RECOMMENDED OPERATING CONDITIONS

ELECTRICAL CHARACTERISTICS

Production Data

ADS5541

SBAS307C – MAY 2004 – REVISED FEBRUARY 2007

ADS5541

MIN

TYP

MAX

UNIT

Supplies

Analog supply voltage, AVDD

3.3

3.6

Output driver supply voltage, DRVDD

3.3

3.6

Analog Input

Differential input range

2.3

VPP

Input common-mode voltage, VCM(1)

1.45

1.55

1.65

Digital Output

Maximum output load

Clock Input

DLL ON

105

ADCLK input sample rate (sine wave) 1/tC

MSPS

DLL OFF

Clock amplitude, sine wave, differential(2)

VPP

Clock duty cycle(3)

50%

Open free-air temperature range

–40

°C

(1)

Input common-mode should be connected to CM.

(2)

See Figure 49 for more information.

(3)

See Figure 48 for more information.

At TA = +25°C, min and max specified over the full temperature range of –40°C to +85°C, AVDD = DRVDD = 3.3V, sampling rate = 105MSPS,

50% clock duty cycle, DLL On, 3VPP differential clock, and –1dBFS differential input, unless otherwise noted.

ADS5541

PARAMETER

CONDITIONS

MIN

TYP

MAX

UNIT

Resolution

Bits

Analog Inputs

Differential input range

2.3

VPP

Differential input impedance

See Figure 39

6.6

Ω

Differential input capacitance

See Figure 39

Analog input common-mode current (per input)

250

µA

Analog input bandwidth

Source impedance = 50

Ω

750

MHz

Voltage overload recovery time

Clock cycles

Internal Reference Voltages

Reference bottom voltage, VREFM

0.95

Reference top voltage, VREFP

2.1

Reference error

–4

±0.9

Common-mode voltage output, VCM

1.5

1.55

1.6

Dynamic DC Characteristics and Accuracy

No missing codes

Tested

Differential nonlinearity error, DNL

fIN = 55 MHz

–0.9

±0.25

1.1

LSB

Integral nonlinearity error, INL

fIN = 55 MHz

–5

±2.5

LSB

Offset error

–11

±1.5

Offset temperature coefficient

0.02

mV/°C

DC power-supply rejection ratio, DC PSRR

∆offset error/∆AV

DD from AVDD = 3 V to AVDD = 3.6V

0.25

mV/V

Gain error(1)

–2

±0.3

%FS

Gain temperature coefficient

–0.02

∆%/°C

(1)

Gain error is specified by design and characterization; it is not tested in production.

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