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PC87393F 데이터시트(PDF) 139 Page - National Semiconductor (TI) |
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PC87393F 데이터시트(HTML) 139 Page - National Semiconductor (TI) |
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139 / 148 page ![]() 9.0 Device Characteristics (Continued) 139 www.national.com 9.4 AC ELECTRICAL CHARACTERISTICS 9.4.1 AC Test Conditions Figure 32. AC Test Conditions, TA =0 °Cto70 °C, VDD = 3.3 V ±10% Notes: 1. CL = 100 pF for all output pins (except OPCI); CL = 50 pF for OPCI output pins; These values include both jig and oscilloscope capacitance. 2. S1 = Open for push-pull output pins. S1 = VDD for high impedance to active low and active low to high impedance measurements. S1 = GND for high impedance to active high and active high to high impedance measurements. RL = 1.0KΩ for µP interface pins. 3. For the FDC open-drive interface pins, S1 = VDD and RL = 150Ω. 9.4.2 Clock Timing . Symbol Parameter 48 MHz Min Max Unit tCH Clock High Pulse Width1 1. Not tested. Guaranteed by design. 8.4 ns tCL Clock Low Pulse Width1 8.4 ns tCP Clock Period 12 2. For the 14.31818 MHz clock, required tolerance is 200 ppm (max). 20 21.5 ns Device Under Test 0.1 µf Input Output RL CL S1 Load Circuit (Notes 1, 2, 3) AC Testing Input, Output Waveform VDD 2.4 0.4 2.0 0.8 Test Points 2.0 0.8 CLKIN tCL tCP tCH |
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