| 전자부품 데이터시트 검색엔진 |
|
CAP1206 데이터시트(PDF) 20 Page - Microchip Technology |
|
|
|||||||||||||||||||||||||||||
CAP1206 데이터시트(HTML) 20 Page - Microchip Technology |
|
20 / 63 page ![]() 2013-2015 Microchip Technology Inc. DS00001567B-page 20 CAP1206 4.8.4 INTERRUPTS FOR MULTIPLE TOUCH PATTERN DETECTION An interrupt can be generated when the MTP pattern is matched (see Section 5.14, "Multiple Touch Pattern Configura- tion Register"). 4.8.5 INTERRUPTS FOR SENSOR INPUT CALIBRATION FAILURES An interrupt can be generated when the ACAL_FAIL bit is set, indicating the failure to complete analog calibration of one or more sensor inputs(see Section 5.2, "Status Registers"). This interrupt can be enabled by setting the ACAL_- FAIL_INT bit (see Section 5.6, "Configuration Registers"). An interrupt can be generated when the BC_OUT bit is set, indicating the base count is out of limit for one or more sen- sor inputs(see Section 5.2, "Status Registers"). This interrupt can be enabled by setting the BC_OUT_INT bit (see Sec- tion 5.6, "Configuration Registers"). |
|
링크 URL |
| ALLDATASHEET 가 귀하에 도움이 되셨나요? [ DONATE ] |
Alldatasheet는? | 광고문의 | 운영자에게 연락하기 | 개인정보취급방침 | 링크 투 데이터시트 | 링크교환 | 제조사별 검색 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |