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LP3971 데이터시트(PDF) 6 Page - Texas Instruments |
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LP3971 데이터시트(HTML) 6 Page - Texas Instruments |
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6 / 52 page ![]() LP3971 SNVS432V – JANUARY 2006 – REVISED MAY 2013 www.ti.com Absolute Maximum Ratings (1) (2) All Inputs −0.3V to +6.5V GND to GND SLUG ±0.3V Junction Temperature (TJ-MAX) 150°C Storage Temperature −65°C to +150°C Power Dissipation (TA = 70°C) (3) 3.2W Junction-to-Ambient Thermal Resistance θJA (3) 25°C/W Maximum Lead Temp (Soldering) 260°C ESD Rating (4) Human Body Model 2 kV Machine Model 200V (1) If Military/Aerospace specified devices are required, please contact the TI Sales Office/Distributors for availability and specifications. (2) Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions under which operation of the device is specified. Operating Ratings do not imply performance limits. For performance limits and associated test conditions, see the Electrical Characteristics tables. (3) In applications where high power dissipation and/or poor package thermal resistance is present, the maximum ambient temperature may have to be derated. Maximum ambient temperature (TA-MAX) is dependent on the maximum operating junction temperature (TJ-MAX- OP = 125°C), the maximum power dissipation of the device in the application (PD-MAX), and the junction-to ambient thermal resistance of the part/package in the application ( θJA), as given by the following equation: TA-MAX = TJ-MAX-OP – (θJA x PD-MAX). (4) The Human body model is a 100 pF capacitor discharged through a 1.5 k Ω resistor into each pin. (MIL-STD-883 3015.7) The machine model is a 200 pF capacitor discharged directly into each pin. (EAIJ) Operating Ratings VIN LDO 4,5 2.7V to 5.5V VEN 1.74 to (VIN Junction Temperature (TJ) −40°C to +125°C Operating Temperature (TA) −40°C to +85°C Maximum Power Dissipation (TA = 70°C) (1) (2) 2.2W (1) In applications where high power dissipation and/or poor package thermal resistance is present, the maximum ambient temperature may have to be derated. Maximum ambient temperature (TA-MAX) is dependent on the maximum operating junction temperature (TJ-MAX- OP = 125°C), the maximum power dissipation of the device in the application (PD-MAX), and the junction-to ambient thermal resistance of the part/package in the application ( θJA), as given by the following equation: TA-MAX = TJ-MAX-OP – (θJA x PD-MAX). (2) Junction-to-ambient thermal resistance ( θJA) is taken from a thermal modeling result, performed under the conditions and guidelines set forth in the JEDEC standard JESD51–7. The test board is a 4-layer FR-4 board measuring 102 mm x 76 mm x 1.6 mm with a 2x1 array of thermal vias. The ground plane on the board is 50 mm x 50 mm. Thickness of copper layers are 36 µm/1.8 µm/18 µm/36 µm (1.5 oz/1 oz/1 oz/1.5 oz). Ambient temperature in simulation is 22°C, still air. Power dissipation is 1W. Junction-to-ambient thermal resistance is highly application and board-layout dependent. In applications where high maximum power dissipation exists, special care must be paid to thermal dissipation issues in board design. The value of θJA of this product can vary significantly, depending on PCB material, layout, and environmental conditions. In applications where high maximum power dissipation exists (high VIN, high IOUT), special care must be paid to thermal dissipation issues. For more information on these topics, please refer to Application Note 1187: Leadless Leadframe Package (LLP) and the Power Efficiency and Power Dissipation section of this datasheet. General Electrical Characteristics (1) Typical values and limits appearing in normal type apply for TJ = 25°C. Limits appearing in boldface type apply over the entire junction temperature range for operation, −40°C to +125°C. (2) (3) Symbol Parameter Conditions Min Typ Max Units VIN, VDDA, VIN Buck1, 2 Battery Voltage 2.7 3.6 5.5 V and 3 VINLDO4, VINLDO5 Power Supply for LDO 4 and 5 1.74 3.6 5.5 V (1) No input supply should be higher then VDDA (2) All voltages are with respect to the potential at the GND pin. (3) All limits specified at room temperature and at temperature extremes. All room temperature limits are production tested, specified through statistical analysis or by design. All limits at temperature extremes are specified via correlation using standard Statistical Quality Control (SQC) methods. All limits are used to calculate Average Outgoing Quality Level (AOQL). 6 Submit Documentation Feedback Copyright © 2006–2013, Texas Instruments Incorporated Product Folder Links: LP3971 |
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