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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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TMS570LS0232PZ 데이터시트(PDF) 53 Page - Texas Instruments |
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TMS570LS0232PZ 데이터시트(HTML) 53 Page - Texas Instruments |
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53 / 109 page  TMS570LS0232 www.ti.com SPNS242A – OCTOBER 2014 – REVISED JUNE 2015 The parity protection for peripheral RAMs is not enabled by default and must be enabled by the application. Each individual peripheral contains control registers to enable the parity protection for accesses to its RAM. NOTE The CPU read access gets the actual data from the peripheral. The application can choose to generate an interrupt whenever a peripheral RAM parity error is detected. 6.14 On-Chip SRAM Initialization and Testing 6.14.1 On-Chip SRAM Self-Test Using PBIST 6.14.1.1 Features • Extensive instruction set to support various memory test algorithms • ROM-based algorithms allow the application to run TI production-level memory tests • Independent testing of all on-chip SRAM 6.14.1.2 PBIST RAM Groups Table 6-22. PBIST RAM Grouping TEST PATTERN (ALGORITHM) MARCH 13N(1) MARCH 13N(1) TRIPLE READ TRIPLE READ TWO PORT SINGLE PORT MEMORY RAM GROUP TEST CLOCK MEM TYPE SLOW READ FAST READ (CYCLES) (CYCLES) ALGO MASK ALGO MASK ALGO MASK ALGO MASK 0x1 0x2 0x4 0x8 PBIST_ROM 1 ROM CLK ROM X X STC_ROM 2 ROM CLK ROM X X DCAN1 3 VCLK Dual Port 12720 DCAN2 4 VCLK Dual Port 6480 RAM 6 HCLK Single Port 133160 MIBSPI1 7 VCLK Dual Port 33440 VIM 10 VCLK Dual Port 12560 MIBADC 11 VCLK Dual Port 4200 N2HET1 13 VCLK Dual Port 25440 HTU1 14 VCLK Dual Port 6480 (1) There are several memory testing algorithms stored in the PBIST ROM. However, TI recommends the March13N algorithm for application testing. The PBIST ROM clock can be divided down from HCLK. The divider is selected by programming the ROM_DIV field of the Memory Self-Test Global Control Register (MSTGCR) at address 0xFFFFFF58. Copyright © 2014–2015, Texas Instruments Incorporated System Information and Electrical Specifications 53 Submit Documentation Feedback Product Folder Links: TMS570LS0232 |
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