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TMS570LS0232PZ 데이터시트(PDF) 68 Page - Texas Instruments |
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TMS570LS0232PZ 데이터시트(HTML) 68 Page - Texas Instruments |
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68 / 109 page ![]() TRST TMS TCK TDI TDO RTCK Boundary BSDL Boundary Scan Interface Scan Device Pins (conceptual) TDI TDO TMS570LS0232 SPNS242A – OCTOBER 2014 – REVISED JUNE 2015 www.ti.com 6.20.7 Boundary Scan Chain The device supports BSDL-compliant boundary scan for testing pin-to-pin compatibility. The boundary scan chain is connected to the Boundary Scan Interface of the ICEPICK module. Figure 6-16. Boundary Scan Implementation (Conceptual Diagram) Data is serially shifted into all boundary-scan buffers through TDI, and out through TDO. 68 System Information and Electrical Specifications Copyright © 2014–2015, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: TMS570LS0232 |
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