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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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TMS570LS0332PZ 데이터시트(PDF) 69 Page - Texas Instruments |
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TMS570LS0332PZ 데이터시트(HTML) 69 Page - Texas Instruments |
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69 / 110 page  TRST TMS TCK TDI TDO RTCK Boundary BSDL Boundary Scan Interface Scan Device Pins (conceptual) TDI TDO TMS570LS0432, TMS570LS0332 www.ti.com SPNS186B – OCTOBER 2012 – REVISED JUNE 2015 6.20.7 Boundary Scan Chain The device supports BSDL-compliant boundary scan for testing pin-to-pin compatibility. The boundary scan chain is connected to the Boundary Scan Interface of the ICEPICK module. Figure 6-17. Boundary Scan Implementation (Conceptual Diagram) Data is serially shifted into all boundary-scan buffers through TDI, and out through TDO. Copyright © 2012–2015, Texas Instruments Incorporated System Information and Electrical Specifications 69 Submit Documentation Feedback Product Folder Links: TMS570LS0432 TMS570LS0332 |
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