DP7112

4

Table 1. OPERATION MODES

INC

CS

U/D

Operation

High to Low

Low

High

High to Low

Low

Low

High

Low to High

X

Store Wiper Position

Low

Low to High

X

No Store, Return to Standby

X

High

X

Standby

Figure 3. Potentiometer Equivalent Circuit

Table 2. ABSOLUTE MAXIMUM RATINGS

Parameters

Ratings

Units

Supply Voltage

0.5 to +7

V

Inputs

CS to GND

V

INC to GND

V

U/D to GND

V

V

V

V

Operating Ambient Temperature

ffix)

40 to +85

C

Junction Temperature

+150

C

Storage Temperature

65 to +150

C

Lead Soldering (10 s max)

+300

C

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

Table 3. RELIABILITY CHARACTERISTICS

Symbol

Parameter

Test Method

Min

Typ

Max

Units

ESD Susceptibility

MIL STD 883, Test Method 3015

2000

V

Latch Up

JEDEC Standard 17

100

mA

Data Retention

MIL STD 883, Test Method 1008

100

Years

Endurance

MIL STD 883, Test Method 1003

1,000,000

Stores

1. This parameter is tested initially and after a design or process change that affects the parameter.