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TMP93CS41F 데이터시트(PDF) 37 Page - Toshiba Semiconductor |
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TMP93CS41F 데이터시트(HTML) 37 Page - Toshiba Semiconductor |
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37 / 48 page ![]() Quality and Reliability Assurance / Handling Precautions 030901 QUA-37 2002-02-20 4.3.7 Load Capacitance Some devices display increased delay times if the load capacitance is large. Also, large charging and discharging currents will flow in the device, causing noise. Furthermore, since outputs are shorted for a relatively long time, wiring can become fused. Consult the technical information for the device being used to determine the recommended load capacitance. 4.3.8 Thermal Design The failure rate of semiconductor devices is greatly increased as operating temperatures increase. As shown in Figure 4.2, the internal thermal stress on a device is the sum of the ambient temperature and the temperature rise due to power dissipation in the device. Therefore, to achieve optimum reliability, observe the following precautions concerning thermal design: (1) Keep the ambient temperature (Ta) as low as possible. (2) If the device’s dynamic power dissipation is relatively large, select the most appropriate circuit board material, and consider the use of heat sinks or of forced air cooling. Such measures will help lower the thermal resistance of the package. (3) Derate the device’s absolute maximum ratings to minimize thermal stress from power dissipation. θja = θjc + θca θja = (Tj – Ta)/P θjc = (Tj – Tc)/P θca = (Tc – Ta)/P in which θja = thermal resistance between junction and surrounding air (°C/W) θjc = thermal resistance between junction and package surface, or internal thermal resistance (°C/W) θca = thermal resistance between package surface and surrounding air, or external thermal resistance (°C/W) Tj = junction temperature or chip temperature (°C) Tc = package surface temperature or case temperature (°C) Ta = ambient temperature (°C) P = power dissipation (W) Tc θca Ta Tj θjc Figure 4.2 Thermal Resistance of Package |
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