STM32L062T8 datasheet(53/118 Pages) STMICROELECTRONICS

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STM32L062x8

Electrical characteristics

6.3.4

Supply current characteristics

The current consumption is a function of several parameters and factors such as the

operating voltage, temperature, I/O pin loading, device software configuration, operating

frequencies, I/O pin switching rate, program location in memory and executed binary code.

The current consumption is measured as described in Figure 10: Current consumption

measurement scheme.

All Run-mode current consumption measurements given in this section are performed with a

reduced code that gives a consumption equivalent to Dhrystone 2.1 code if not specified

otherwise.

The current consumption values are derived from the tests performed under ambient

temperature and VDD supply voltage conditions summarized in Table 21: General operating

conditions unless otherwise specified.

The MCU is placed under the following conditions:

•

All I/O pins are configured in analog input mode

•

All peripherals are disabled except when explicitly mentioned

•

The Flash memory access time and prefetch is adjusted depending on fHCLK

frequency and voltage range to provide the best CPU performance unless otherwise

specified.

•

When the peripherals are enabled fAPB1 = fAPB2 = fAPB

•

When PLL is ON, the PLL inputs are equal to HSI = 16 MHz (if internal clock is used)

•

For maximum current consumption VDD = VDDA = 3.6 V is applied to all supply pins

•

For typical current consumption VDD = VDDA = 3.0 V is applied to all supply pins if not

specified otherwise

The parameters given in Table 42, Table 21 and Table 22 are derived from tests performed

under ambient temperature and VDD supply voltage conditions summarized in Table 21.

ILPBUF(4)

Consumption of reference

voltage buffer for VREF_OUT

and COMP

730

1200

VREFINT_DIV1(4) 1/4 reference voltage

VREFINT

VREFINT_DIV2(4) 1/2 reference voltage

VREFINT_DIV3(4) 3/4 reference voltage

1. Refer to Table 34: Peripheral current consumption in Stop and Standby mode for the value of the internal reference current

consumption (IREFINT).

2. Guaranteed by test in production.

3. The internal VREF value is individually measured in production and stored in dedicated EEPROM bytes.

4. Guaranteed by design.

5. Shortest sampling time can be determined in the application by multiple iterations.

6. To guarantee less than 1% VREF_OUT deviation.

Table 24. Embedded internal reference voltage(1) (continued)

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

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