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ST6G3244ME 데이터시트(PDF) 16 Page - STMicroelectronics |
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ST6G3244ME 데이터시트(HTML) 16 Page - STMicroelectronics |
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16 / 27 page ![]() Data transmission ST6G3244ME 16/27 Doc ID 022157 Rev 2 6.1 Test circuit from host to SD Card The test circuit from the host to the SD Card is shown in Figure 6. Timings are measured for the whole line cell (translator + EMI + ESD) on an external load CSD = 15 pF (board capacitance 5 pF + SD Card capacitance 10 pF). Figure 6. Test circuit from host to SD Card 6.2 Test circuit from SD Card to host The test circuit from the SD Card to the host is shown in Figure 7. Timings are measured for the whole line cell (translator + EMI + ESD) on an external load CHOST = 10 pF (board capacitance + host capacitance). Figure 7. Test circuit from SD Card to host tr_CLKF Rise time for CLK feedback See Section 6.2 VCCB = 1.8 V 1.0 3 ns VCCB = 2.9 V 1.0 3 tf_CLKF Fall time for CLK feedback See Section 6.2 VCCB = 1.8 V 1.0 3 ns VCCB = 2.9 V 1.0 3 fMAX Clock rate 60 MHz Data rate 120 Mbps 1. The time after the .dir signal transition that the device needs to switch direction, after that it is ready to accept valid data on the switched input. Table 12. AC characteristics (TA = –40 °C to 85 °C) (continued) Symbol Parameter Test condition Min. Typ. Max. Unit HOST SD Card CSD = 15 pF AM04960v2 HOST SD Card CHOST = 10 pF AM04961v2 |
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