Application information

OA1NP, OA2NP, OA4NP

18/31

DocID025993 Rev 2

4.4

Long term input offset voltage drift

To evaluate product reliability, two types of stress acceleration are used:



Voltage acceleration, by changing the applied voltage



Temperature acceleration, by changing the die temperature (below the maximum

junction temperature allowed by the technology) with the ambient temperature.

The voltage acceleration has been defined based on JEDEC results, and is defined using

Equation 2.

Equation 2

Where:

The temperature acceleration is driven by the Arrhenius model, and is defined in Equation 3.

Equation 3

Where:

the temperature acceleration factor (Equation 4).

Equation 4

use equivalent to 1000 hours of reliable stress duration.

A

FV

e

 V

S

V

U

–





=

A

FT

e

E

a

k

------

1

T

U

------

1

T

S

------

–







=

A

F

A

FT

A

FV



=